Zuchongzhi 3.0
USTC / Hefei National Laboratory
Zuchongzhi 3.0
Register profile — the machine's variant of its architecture
qubit type: tunable transmon, tantalum-aluminium on sapphire
gate mechanism: tunable coupler CZ-family; 1Q 28 ns, 2Q 45 ns
connectivity: rectangular lattice, average connectivity 3.5
control: room-temperature RF
control placement: room-temp
readout: dispersive
gate evidence: a number stated by the vendor, protocol unstated
flags: estimated baseline
Technologies by layer — the machine's cell per layer
| 1 Qubit carrier | |
| 2 Encoding | Bare physical qubit (no encoding) · primary ◌ 🔎 Bare two-level subspace — Computational subspace of an anharmonic oscillator; leakage to |2⟩ is the price. |
| 3 Gate mechanism | Tunable-coupler CZ / iSWAP · primary ▣ Fig. 1c (two qubits via coupler); §II ✅ tunable couplers (182), CZ-family; 1Q ≈28 ns, 2Q ≈45 ns; parallel 1Q 99.90%, 2Q 99.62% (Mar 2025) |
| 4 Connectivity / transport | Static nearest-neighbour lattice · primary ▣ Fig. 1b (qubit/coupler topology) ✅ 15×7 rectangular lattice with 182 tunable couplers; average connectivity ≈3.5 |
| 5 Control | Room-temperature electronics + per-qubit coax/flex · primary ▣ Fig. 1a (control lines on second chip); §II (wiring attenuators) ✅ room-temperature RF |
| 6 Readout | Dispersive microwave readout (+TWPA, Purcell) · primary ▣ Fig. 1a (readout resonators on second chip); §II ✅ dispersive; readout 99.18% (arXiv) / 99.13% (USTC release), sources conflict |
| 7 Code | — none — nothing in this layer ▤ §III (large-scale random circuit sampling) ✅ no QEC code run on 3.0 (NISQ); RCS 83 q × 32 cycles, 10⁶ samples in a few hundred seconds; surface-code d=7 work stated separately |
| 8 Decoder | |
| 9 Interconnect | Multi-die packaging in one module (flip-chip, bump-bonded control die) · primary ▣ Fig. 1a (two sapphire chips, flip-chip) ✅ flip-chip: two chips bonded face-to-face, separating qubit layer from routing; one module, no inter-module interconnect |
| 10 Manufacturing | Superconducting-qubit lithography (Al/AlOx/Al junctions, Nb wiring, 300 mm) · primary ▤ §II (fabrication procedure) ✅ |
Standard records
connectivity degree → 3.5 neighbours · typical (mean)
Mar 2025 · source
2Q error under full-width parallel operation → 3.80e-3 · typical (99.62% parallel 2Q)
Mar 2025 · source
SPAM error → 8.20e-3 · typical (readout error; sources give 8.2e-3 and 8.7e-3)
Mar 2025 · source
T1 relaxation → 72 µs · typical
Mar 2025 · source
1Q gate time → 28 ns · best
Mar 2025 · source
T2 coherence (echo/DD) → 58 µs · typical
Mar 2025 · source
evidence: ✅ 8 / 10
Pictures
Every picture carries the story of what it shows and its credit line.
