Toshiba double-transmon coupler
Toshiba + RIKEN RQC + University of Tokyo
Toshiba double-transmon coupler
Register profile — the machine's variant of its architecture
qubit type: fixed-frequency transmon
gate mechanism: double-transmon coupler (two transmons sharing a three-junction loop), external flux switches the interaction; CZ 48 ns
connectivity: two-qubit test pair
control: room-temperature RF; a shunt capacitance variant removes DC bias current at idle
control placement: room-temp
readout: dispersive
gate evidence: a benchmark paper with its protocol
flags: a component, not a machine
Technologies by layer — the machine's cell per layer
| 1 Qubit carrier | |
| 2 Encoding | Bare physical qubit (no encoding) · primary ◌ 🔎 Bare two-level subspace — Computational subspace of an anharmonic oscillator; leakage to |2⟩ is the price. |
| 3 Gate mechanism | Tunable-coupler CZ / iSWAP · primary ▣ Fig. 1a (DTC circuit); §IV CZ-gate implementation; Fig. 4c-d (interleaved RB; 12-hour CZ-error run); Fig. 5 (error vs gate length) ✅ double-transmon coupler (two transmons, three-junction loop), flux-switched; CZ 99.90% averaged over 12 h at 48 ns; residual ZZ ≈6 kHz off (Nov 2024) |
| 4 Connectivity / transport | Static nearest-neighbour lattice · primary ▣ Fig. 1b (false-color picture of the two-qubit device: Q1-Q2 joined by the DTC) ✅ two-qubit test pair (degree 1); no multi-qubit DTC processor exists |
| 5 Control | Room-temperature electronics + per-qubit coax/flex · primary ▣ Fig. 6 (schematic diagram of the measurement setup); Appendix B Measurement setup; Fig. 2 (Z-pulse on coupler loop) ✅ room-temperature RF with external flux bias; shunt-capacitance variant idles at zero flux, no DC bias current (PRApplied 23, 064069, Jun 2025) |
| 6 Readout | Dispersive microwave readout (+TWPA, Purcell) · primary ▣ Fig. 1a (readout elements); Fig. 10 (single-shot readouts of the three resonators); Appendix F State discrimination ✅ dispersive |
| 7 Code | |
| 8 Decoder | |
| 9 Interconnect | |
| 10 Manufacturing | Superconducting-qubit lithography (Al/AlOx/Al junctions, Nb wiring, 300 mm) · primary ▤ Appendix A: Fabrication ✅ |
Standard records
crosstalk → 6.0e+3 Hz · best published for superconducting (residual ZZ in the off state)
Nov 2024 · source
2Q error under full-width parallel operation → 1.00e-3 · best-of-line (99.90% CZ averaged over 12 h on a 2-qubit device)
Nov 2024 · source
T1 relaxation → 230 µs · best
Nov 2024 · source
T2 coherence (echo/DD) → 360 µs · best
Nov 2024 · source
evidence: ✅ 6 / 10
Pictures
Every picture carries the story of what it shows and its credit line.
