Advanced Quantum Testbed (AQT)
Lawrence Berkeley National Laboratory
Advanced Quantum Testbed (AQT)
Register profile — the machine's variant of its architecture
qubit type: fixed-frequency transmon (5.2-5.8 GHz, ~250 MHz anharmonicity); qutrit operation
gate mechanism: cross-resonance between fixed-frequency qubits; all-microwave CZ; parametric fSim
connectivity: ring, nearest-neighbour
control: QubiC 2.0 (Xilinx ZCU216 RFSoC + custom analog front end); Zurich Instruments HDAWG/UHFQA/PQSC
control placement: room-temp
readout: multiplexed dispersive readout with TWPA; three-state readout fidelity >95%
gate evidence: no published figure
Technologies by layer — the machine's cell per layer
| 1 Qubit carrier | |
| 2 Encoding | Bare physical qubit (no encoding) · primary ◌ 🔎 bare transmon levels; three-state (qutrit) operation also offered |
| 3 Gate mechanism | Cross-resonance (fixed-frequency, all-microwave) · primary ▦ ✅ cross-resonance CNOT between fixed-frequency nearest neighbours, error 1-4%; all-microwave CZ 0.5-1% |
| 4 Connectivity / transport | |
| 5 Control | Room-temperature electronics + per-qubit coax/flex · primary ▦ ✅ room-temperature QubiC 2.0 RFSoC controller and Zurich Instruments electronics; mid-circuit measurement and fast feedback |
| 6 Readout | Dispersive microwave readout (+TWPA, Purcell) · primary ▦ ✅ multiplexed dispersive readout with TWPA; three-state readout fidelity >95% |
| 7 Code | — none — nothing in this layer ◌ 🔎 no QEC code as a machine feature; open testbed for control and QCVV methods |
| 8 Decoder | |
| 9 Interconnect | |
| 10 Manufacturing | Superconducting-qubit lithography (Al/AlOx/Al junctions, Nb wiring, 300 mm) · primary ◌ 🔎 superconducting-qubit lithography; primary chip fab site not stated (9-qubit chip from MIT-LL) |
evidence: ✅ 5 / 10